EFFECT OF MODULATION AMPLITUDE ON ELECTRON-EXCITED AUGER DATA FROM TITANIUM

被引：65
作者：
GRANT, JT
HAAS, TW
HOUSTON, JE
机构：
[1] AEROSP RES LABS,WRIGHT P AFB,OH 45433
[2] SANDIA LABS,ALBUQUERQUE,NM 87115
来源：
SURFACE SCIENCE | 1974年 / 42卷 / 01期
关键词：
D O I：
10.1016/0039-6028(74)90002-8
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：1 / 11
页数：11
相关论文
共 13 条
[1]   ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J].
BISHOP, HE ;
RIVIERE, JC .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) :1740-&
[2]   AUGER SPECTROSCOPY OF SILICON [J].
BISHOP, HE ;
RIVIERE, JC ;
TAYLOR, NJ .
SURFACE SCIENCE, 1969, 17 (02) :462-&
[3]   QUANTITATIVE AUGER ANALYSIS USING INTEGRATION TECHNIQUES [J].
GRANT, JT ;
HAAS, TW ;
HOUSTON, JE .
PHYSICS LETTERS A, 1973, A 45 (04) :309-310
[4]  
GRANT JT, 1974, J VACUUM SCI TECHNOL, V11
[5]   ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J].
HARRIS, LA .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) :1419-&
[6]  
HOSEMANN R, 1962, DIRECT ANALYSIS DIFF
[7]   EXACT CORRECTIONS FOR POTENTIAL MODULATION DISTORTION IN AUGER YIELD MEASUREMENTS [J].
HOUSTON, JE .
SURFACE SCIENCE, 1973, 38 (02) :283-291
[8]   INSTRUMENT RESPONSE FUNCTIONS FOR POTENTIAL MODULATION DIFFERENTIATION [J].
HOUSTON, JE ;
PARK, RL .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (10) :1437-&
[9]  
HOUSTON JE, TO BE PUBLISHED
[10]   AUGER PEAKS IN THE ENERGY SPECTRA OF SECONDARY ELECTRONS FROM VARIOUS MATERIALS [J].
LANDER, JJ .
PHYSICAL REVIEW, 1953, 91 (06) :1382-1387
12