STUDY OF FAULTED DIPOLES IN COPPER USING WEAK-BEAM ELECTRON-MICROSCOPY

被引:43
作者
CARTER, CB [1 ]
HOLMES, SM [1 ]
机构
[1] UNIV OXFORD,DEPT MET & SCI MAT,PARKS RD,OXFORD,ENGLAND
来源
PHILOSOPHICAL MAGAZINE | 1975年 / 32卷 / 03期
关键词
D O I
10.1080/14786437508220883
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:599 / 614
页数:16
相关论文
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