ADAPTIVE RANDOM TEST GENERATION

被引：0
|
作者：
PARKER, KP [1 ]
机构：
[1] HEWLETT PACKARD CO,AUTOMAT MEASUREMENT DIV,SUNNYVALE,CA
来源：
JOURNAL OF DESIGN AUTOMATION & FAULT-TOLERANT COMPUTING | 1976年 / 1卷 / 01期
关键词：
CONTROL SYSTEMS; ADAPTIVE - PROBABILITY - Random Processes;
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Various approaches to the problem of generating a set of fault detection tests for digital circuitry can be broadly categorized as deterministic or random. A method is described for increasing the efficiency of random test generation by adaptively controlling the source statistics. Several examples are given. The random test generation process is modelled with a Markov chain. With this model, insight is gained into the nature of random test generation, and the advantages of adaptive control are illustrated. Finally, factors governing the success of adaptive random test generation are explored, and further research suggested.
引用
收藏
页码：62 / 83
页数：22
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