SMALL-ANGLE X-RAY-SCATTERING EVIDENCE FOR ABSENCE OF VOIDS IN CHALCOGENIDE GLASSES

被引：34

作者：

BISHOP, SG

SHEVCHIK, NJ

机构：

[1] USN, RES LAB, WASHINGTON, DC 20375 USA

[2] MAX PLANCK INST FESTKORPER FORSCH, STUTTGART, WEST GERMANY

来源：

SOLID STATE COMMUNICATIONS | 1974年 / 15卷 / 03期

关键词：

D O I：

10.1016/0038-1098(74)91159-4

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：629 / 633

页数：5

共 19 条

[1] NATURE OF LOCALIZED STATES IN AMORPHOUS SEMICONDUCTORS - STUDY BY ELECTRON-SPIN RESONANCE [J].

AGARWAL, C .

PHYSICAL REVIEW B, 1973, 7 (02) :685-691

[2]

APLING AJ, 1973, ELECTRONIC STRUCTURA

[3] ATOMIC REORIENTATION RATES IN LIQUID CHALCOGENIDE GLASSES - NMR IN SE AND AS2SE3 [J].

BISHOP, SG ;

TAYLOR, PC .

SOLID STATE COMMUNICATIONS, 1972, 11 (10) :1323-&

[4] ELECTRON SPIN RESONANCE IN AMORPHOUS SILICON, GERMANIUM, AND SILICON CARBIDE [J].

BRODSKY, MH ;

TITLE, RS .

PHYSICAL REVIEW LETTERS, 1969, 23 (11) :581-&

[5] ANISOTROPIC MICROSTRUCTURE IN EVAPORATED AMORPHOUS GERMANIUM FILMS [J].

CARGILL, GS .

PHYSICAL REVIEW LETTERS, 1972, 28 (21) :1372-&

[6]

Guinier A., 1955, SMALL ANGLE SCATTERI

[7] CRYSTALLINE ORDERING IN SILICA AND GERMANIA GLASSES [J].

KONNERT, JH ;

KARLE, J ;

FERGUSON, GA .

SCIENCE, 1973, 179 (4069) :177-179

[8] EVIDENCE OF VOIDS WITHIN AS-DEPOSITED STRUCTURE OF GLASSY SILICON [J].

MOSS, SC ;

GRACZYK, JF .

PHYSICAL REVIEW LETTERS, 1969, 23 (20) :1167-&

[9]

MOTT NF, 1971, ELECTRONIC PROCESSES

[10]

Paul W., 1972, J NONCRYSTALLINE SOL, V8-10, P381, DOI [10.1016/0022-3093(72)90164-0, DOI 10.1016/0022-3093(72)90164-0]

← 1 2 →