A DIAKOPTICAL TECHNIQUE FOR SHORT-CIRCUIT STUDIES OF LARGE-SIZE POWER-SYSTEM NETWORKS

The paper presents a diakoptical technique for deriving the impedance matrices required for short circuit studies of large size power system networks by tearing the system into smaller subsystems by cutting appropriate tie lines. The bus admittance matrix is formed for the sequence networks of each subsystem and then modified later by means of diakoptics. The simulation of mutual couplings is taken into account in the zero sequence networks. Only columns of the impedance matrices corresponding to the faulted buses are computed in the proposed technique which is based on factorized bus admittance matrices and full exploitation of sparsity. The proposed technique can either be used in a single-processor computer for sequential solution of torn subsystems or in a multicomputer configuration for a faster solution by parallel processing of torn subsystems. Both symmetrical and unsymmetrical faults are studied by using the proposed technique which produces exact results as the untorn system. No iterative calculations are required as short circuit analysis is basically a linear problem. included in this paper is a numerical example of a sample test system.