IMPROVED VOLTAGE MEASUREMENT SYSTEM USING SCANNING ELECTRON-MICROSCOPE

被引：20
|
作者：
TEE, WJ [1 ]
GOPINATH, A [1 ]
机构：
[1] UNIV WALES,UNIV COLL N WALES,SCH ELECTR ENGN SCI,BANGOR LL57 2UW,GWYNEDD,WALES
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1977年 / 48卷 / 03期
关键词：
D O I：
10.1063/1.1135024
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：350 / 355
页数：6
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