Determination of cut-off wavelength and composition distribution in Hg1-xCdxTe

被引：0
|
作者：
Junhao Chu
Yongsheng Gui
Biao Li
Dingyuan Tang
机构：
[1] Chinese Academy of Science,National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics
来源：
Journal of Electronic Materials | 1998年 / 27卷
关键词：
Composition uniformity; cut-off wavelength; HgCdTe;
D O I：
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中图分类号：
学科分类号：
摘要：
The determination of cut-off wavelength, λco, and composition distribution for Hg1-xCdxTe has been discussed in this paper. A shift of the cut-off wavelength was found from the photo-response calculation for the HgCdTe devices with the same energy gap Eg but different thickness d. An expression of λco(x,T,d) has been derived from the half-maximum photo-response curve calculation. The composition uniformity has been determined from the room-temperature transmission fitting procedure. The composition real space distribution is suggested to be determined by the combination of absorption edge phenomenon and thermal imaging technique.
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页码：718 / 721
页数：3
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