Effect of thermal annealing on the structure of ZnSe/Al2O3 nanocomposite films

被引：0
|
作者：
A. A. Dedyukhin
P. N. Krylov
N. V. Kostenkov
R. M. Zakirova
I. V. Fedotova
机构：
[1] Udmurt State University,
来源：
Technical Physics | 2016年 / 61卷
关键词：
ZnSe; Electron Diffraction Pattern; Nanocomposite Film; Amorphous Matrix; Aluminum Oxide Layer;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The ZnSe/Al2O3 nanocomposite films synthesized by laser evaporation followed by heat treatment are studied. X-ray diffraction and electron-microscopic investigations of the as-deposited films demonstrate the presence of ZnSe crystallites in an Al2O3 amorphous matrix. Annealing changes the structures of ZnSe and Al2O3, increases the ZnSe crystallite size, and causes the appearance of the ZnSeO4 phase. The presence of aluminum oxide layers decreases the phase transformation temperature of zinc selenide.
引用
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页码：569 / 573
页数：4
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