Manufacturing at Nanoscale: Top-Down, Bottom-up and System Engineering

被引:0
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作者
Xiang Zhang
Cheng Sun
Nicholas Fang
机构
[1] University of California,Center for Scalable and Integrated Nanomanufacturing, Department of Mechanical and Aerospace Engineering
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关键词
nanoscale; manufacturing; plasmonic imaging lithography; ultra-molding and imprinting; hybrid top-down and bottom-up process; system engineering;
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摘要
The current nano-technology revolution is facing several major challenges: to manufacture nanodevices below 20 nm, to fabricate three-dimensional complex nano-structures, and to heterogeneously integrate multiple functionalities. To tackle these grand challenges, the Center for Scalable and Integrated NAno-Manufacturing (SINAM), a NSF Nanoscale Science and Engineering Center, set its goal to establish a new manufacturing paradigm that integrates an array of new nano-manufacturing technologies, including the plasmonic imaging lithography and ultramolding imprint lithography aiming toward critical resolution of 1–10 nm and the hybrid top-down and bottom-up technologies to achieve massively parallel integration of heterogeneous nanoscale components into higher-order structures and devices. Furthermore, SINAM will develop system engineering strategies to scale-up the nano-manufacturing technologies. SINAMs integrated research and education platform will shed light to a broad range of potential applications in computing, telecommunication, photonics, biotechnology, health care, and national security.
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页码:125 / 130
页数:5
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