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Manufacturing at Nanoscale: Top-Down, Bottom-up and System Engineering
被引:0
|作者:
Xiang Zhang
Cheng Sun
Nicholas Fang
机构:
[1] University of California,Center for Scalable and Integrated Nanomanufacturing, Department of Mechanical and Aerospace Engineering
来源:
关键词:
nanoscale;
manufacturing;
plasmonic imaging lithography;
ultra-molding and imprinting;
hybrid top-down and bottom-up process;
system engineering;
D O I:
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学科分类号:
摘要:
The current nano-technology revolution is facing several major challenges: to manufacture nanodevices below 20 nm, to fabricate three-dimensional complex nano-structures, and to heterogeneously integrate multiple functionalities. To tackle these grand challenges, the Center for Scalable and Integrated NAno-Manufacturing (SINAM), a NSF Nanoscale Science and Engineering Center, set its goal to establish a new manufacturing paradigm that integrates an array of new nano-manufacturing technologies, including the plasmonic imaging lithography and ultramolding imprint lithography aiming toward critical resolution of 1–10 nm and the hybrid top-down and bottom-up technologies to achieve massively parallel integration of heterogeneous nanoscale components into higher-order structures and devices. Furthermore, SINAM will develop system engineering strategies to scale-up the nano-manufacturing technologies. SINAMs integrated research and education platform will shed light to a broad range of potential applications in computing, telecommunication, photonics, biotechnology, health care, and national security.
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页码:125 / 130
页数:5
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