Low-voltage scanning electron microscopy of multilayer polymer systems

被引：0
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作者：
A. S. Orekhov
V. V. Klechkovskaya
S. V. Kononova
机构：
[1] National Research Centre “Kurchatov Institute”,Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”
[2] Russian Academy of Sciences,Institute of Macromolecular Compounds
[3] Russian Academy of Sciences,undefined
来源：
Crystallography Reports | 2017年 / 62卷
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摘要：
The possibilities of low-voltage scanning electron microscopy for visualization of specific features of the microstructure in internal layers of multilayer polymer films are demonstrated by the example of “chitosan–polyelectrolyte complex–alginic acid” composite. The process of electron beam interaction with a sample at low electron energies is considered. The key parameters of low-voltage electron microscopy, which make it possible to increase the resolution of SEM images of polymer systems, are discussed.
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页码：710 / 715
页数：5
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