Little probe, big data

被引:0
|
作者
Gitti L. Frey
Yaron Kauffmann
机构
[1] Technion — Israel Institute of Technology,Department of Materials Science and Engineering
[2] Technion — Israel Institute of Technology,Electron Microscopy Center, Department of Materials Science and Engineering
来源
Nature Materials | 2019年 / 18卷
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摘要
Thousands of electron diffraction patterns, collected stepwise by scanning transmission electron microscopy, are synchronized and mined to provide unprecedented maps of the nanostructure of ordered domains in organic electronics films.
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页码:776 / 777
页数:1
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