Glancing-incidence X-ray diffraction of Ag nanoparticles in gold lustre decoration of Italian Renaissance pottery

被引:0
|
作者
E. Bontempi
P. Colombi
L.E. Depero
L. Cartechini
F. Presciutti
B.G. Brunetti
A. Sgamellotti
机构
[1] Università di Brescia,Laboratorio di Chimica per le Tecnologie and INSTM
[2] Università di Perugia,Istituto di Scienze e Tecnologie Molecolari–CNR, Sezione di Perugia, c/o Dipartimento di Chimica
[3] Università di Perugia,INSTM and Centro di Eccellenza SMAArt, Dipartimento di Chimica
来源
Applied Physics A | 2006年 / 83卷
关键词
Nanoparticle Layer; Glassy Network; GIXRD Pattern; Decorative Technique; Gold Lustre;
D O I
暂无
中图分类号
学科分类号
摘要
Lustre is known as one of the most significant decorative techniques of Medieval and Renaissance pottery in the Mediterranean basin, characterized by brilliant gold and red metallic reflections and iridescence effects. Previous studies by various techniques (SEM-EDS and TEM, UV-VIS, XRF, RBS and EXAFS) demonstrated that lustre consists of a heterogeneous metal-glass composite film, formed by Cu and Ag nanoparticles dispersed within the outer layer of a tin-opacified lead glaze. In the present work the investigation of an original gold lustre sample from Deruta has been carried out by means of glancing-incidence X-ray diffraction techniques (GIXRD). The study was aimed at providing information on structure and depth distribution of Ag nanoparticles. Exploiting the capability of controlling X-ray penetration in the glaze by changing the incidence angle, we used GIXRD measurements to estimate non-destructively thickness and depth of silver particles present in the first layers of the glaze.
引用
收藏
页码:543 / 546
页数:3
相关论文
共 50 条
  • [1] Glancing-incidence X-ray diffraction of Ag nanoparticles in gold lustre decoration of Italian Renaissance pottery
    Bontempi, E
    Colombi, P
    Depero, LE
    Cartechini, L
    Presciutti, F
    Brunetti, BG
    Sgamellotti, A
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2006, 83 (04): : 543 - 546
  • [2] Glancing-incidence X-ray diffraction for depth profiling of polycrystalline layers
    Colombi, P
    Zanola, P
    Bontempi, E
    Roberti, R
    Gelfi, M
    Depero, LE
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2006, 39 : 176 - 179
  • [3] Nanometer coatings of hydroxyapatite characterized by glancing-incidence X-ray diffraction
    Mello, A.
    Mavropoulos, E.
    Hong, Z.
    Ketterson, J.B.
    Rossi, A.M.
    Key Engineering Materials, 2009, 396-398 : 369 - 372
  • [4] Nanometer Coatings of Hydroxyapatite Characterized by Glancing-Incidence X-ray Diffraction
    Mello, A.
    Mavropoulos, E.
    Hong, Z.
    Ketterson, J. B.
    Rossi, A. M.
    BIOCERAMICS 21, 2009, 396-398 : 369 - 372
  • [5] X-ray reflectivity and glancing-incidence diffraction from thin metallic Cr layers
    Bontempi, E
    Depero, LE
    Sanagaletti, L
    PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 2000, 80 (04): : 623 - 633
  • [6] SPECIFICATION OF GLANCING-INCIDENCE AND NORMAL-INCIDENCE X-RAY MIRRORS
    CHURCH, EL
    TAKACS, PZ
    OPTICAL ENGINEERING, 1995, 34 (02) : 353 - 360
  • [7] Glancing-incidence X-ray characterization of Nb/Pd multilayers
    Tagliente, MA
    DelVecchio, A
    Tapfer, L
    Coccorese, C
    Mercaldo, L
    Maritato, L
    Slaughter, JM
    Falco, CM
    NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS, 1997, 19 (2-4): : 473 - 480
  • [8] Glancing-incidence X-ray characterization of Nb/Pd multilayers
    Tagliente, M. A.
    Del Vecchio, A.
    Tapfer, L.
    Coccorese, C.
    Nuovo Cimento Della Societa Italiana Di Fisica. D, Condensed Matter, Atomic, Molecular and Chemical Physics, Biophysics, 1997, 19 (2-4):
  • [9] DESIGN OF A GLANCING-INCIDENCE X-RAY TELESCOPE-MICROSCOPE SYSTEM
    SHEALY, DL
    HOOVER, RB
    KASSIM, A
    CHAO, S
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (12) : 1730 - 1730
  • [10] Nondestructive depth profiling by glancing-incidence and -takeoff X-ray fluorescence
    Tsuji, K
    Sato, S
    Hirokawa, K
    MATERIALS TRANSACTIONS JIM, 1996, 37 (03): : 295 - 298