Gamma irradiation effects on the charge carriers lifetimes in silicon

被引:0
|
作者
Abdul-Wali Ajlouni
Fahad Mohammad Al-Alweet
机构
[1] Umm Al-Qura University (UQU),Physics Department, College of Applied Sciences
[2] King Abdulaziz City for Science and Technology (KACST),National Solar Energy Technology Center, Water and Energy Research Institute
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:15440 / 15450
页数:10
相关论文
共 50 条
  • [1] Gamma irradiation effects on the charge carriers lifetimes in silicon
    Ajlouni, Abdul-Wali
    Al-Alweet, Fahad Mohammad
    JOURNAL OF MATERIALS SCIENCE, 2022, 57 (32) : 15440 - 15450
  • [2] Effect of gamma irradiation on transport of charge carriers in Cu nanowires
    Gehlawat, Devender
    Chauhan, R. P.
    Sonkawade, R. G.
    Chakarvarti, S. K.
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2012, 106 (01): : 157 - 164
  • [3] Effect of gamma irradiation on transport of charge carriers in Cu nanowires
    Devender Gehlawat
    R. P. Chauhan
    R. G. Sonkawade
    S. K. Chakarvarti
    Applied Physics A, 2012, 106 : 157 - 164
  • [4] Recombination and lifetimes of charge carriers in semiconductors
    Volovichev, IN
    Logvinov, GN
    Titov, OY
    Gurevich, YG
    JOURNAL OF APPLIED PHYSICS, 2004, 95 (08) : 4494 - 4496
  • [5] SOME EFFECTS OF FAST NEUTRON IRRADIATION ON CARRIER LIFETIMES IN SILICON
    BECK, RW
    PASKELL, E
    PEET, CS
    JOURNAL OF APPLIED PHYSICS, 1959, 30 (09) : 1437 - 1439
  • [6] MEASUREMENT OF SHORT LIFETIMES OF CHARGE CARRIERS IN GERMANIUM
    SMIRNOV, LS
    SOVIET PHYSICS-TECHNICAL PHYSICS, 1957, 2 (11): : 2299 - 2301
  • [7] RECOMBINATION LIFETIMES IN GAMMA-IRRADIATED SILICON
    HEWES, RA
    JOURNAL OF APPLIED PHYSICS, 1968, 39 (09) : 4106 - &
  • [8] INSTRUMENT FOR MEASURING SHORT LIFETIMES OF HOT CHARGE CARRIERS IN SEMICONDUCTORS
    IVANOV, VG
    MOROZOV, AI
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1968, (04): : 1011 - &
  • [9] Measuring femtosecond lifetimes of free charge carriers in gallium arsenide
    Levashova, A. E.
    Pastor, A. A.
    Serdobintsev, P. Yu
    Chaldyshev, V. V.
    TECHNICAL PHYSICS LETTERS, 2014, 40 (06) : 513 - 515
  • [10] A Contactless Method for Measuring the Lifetimes of Nonequilibrium Charge Carriers in Semiconductors
    N. B. Radchuk
    A. Yu. Ushakov
    Instruments and Experimental Techniques, 2003, 46 : 388 - 390