Characteristics of the surface-intrinsic Josephson junction

被引：0

作者：

Yang L. ^{[1
]}

Xu W.-W. ^{[1
]}

Ye S.-L. ^{[1
]}

Guo D.-Y. ^{[1
]}

You L.-X. ^{[1
]}

Wu P.-H. ^{[1
]}

机构：

[1] Department of Electronic Science and Engineering, Research Institute of Superconductor Electronics, Nanjing University

来源：

Frontiers of Physics in China | 2006年 / 1卷 / 1期

基金：

中国国家自然科学基金;

关键词：

High-temperature superconductor; Intrinsic junction; Josephson junction; Surface junction;

D O I：

10.1007/s11467-005-0004-6

中图分类号：

学科分类号：

摘要：

During the fabrication of intrinsic Josephson junctions (IJJs) with Bi 2Sr2CaCu2O8+δ (BSCCO) single crystals, the superconductivity of the surface Cu-O layer is degraded because of a deposited metal film on top of the stack. Thus, the characteristics of the surface junction consisting of the surface Cu-O double layers remarkably differ from those of the junctions deep in the stack, which will be referred to as ordinary IJJs. The electrical transport characteristics of the surface junction, such as I-V, I c′-T, and R-T, show that the critical temperature T c′ of the surface junction is always lower than that of ordinary IJJs, and that the change of its critical current I c′ with temperature is different from that of ordinary IIJs. Furthermore, by shunting the surface junction resistively, we are able to observe the AC Josephson effect at 3-mm waveband. © Higher Education Press and Springer-Verlag 2006.

引用

页码：122 / 124

页数：2

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