Small-scale materials behavior from X-ray microdiffraction and imaging

被引：0
|
作者：
Rozaliya I. Barabash
Gene E. Ice
机构：
[1] University of Tennessee,Materials Science and Engineering Department
[2] Oak Ridge National Laboratory in Tennessee,undefined
来源：
JOM | 2010年 / 62卷
关键词：
Sidual Compression; Large Single Crystal; Paul Scherre Institute; Total Dislocation Density; Advance Light Source;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
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页码：21 / 21
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