Author Correction: Orientational Mapping Augmented Sub-Wavelength Hyper-Spectral Imaging of Silk

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作者
Meguya Ryu
Armandas Balčytis
Xuewen Wang
Jitraporn Vongsvivut
Yuta Hikima
Jingliang Li
Mark J. Tobin
Saulius Juodkazis
Junko Morikawa
机构
[1] Tokyo Institute of Technology,Nanotechnology facility, Center for Micro
[2] Swinburne University of Technology,Photonics
[3] Center for Physical Sciences and Technology,Department of Laser Technologies
[4] Australian Synchrotron,Infrared Microspectroscopy Beamline
[5] Kyoto University,Department of Chemical Engineering, Graduate School of Engineering
[6] Deakin University,Institute for Frontier Materials
[7] King Abdulaziz University,Center of Nanotechnology
[8] Australian National Fabrication Facility,Melbourne Center for Nanofabrication
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摘要
A correction to this article has been published and is linked from the HTML version of this paper. The error has been fixed in the paper.
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