Photon path length distribution in random media from spectral speckle intensity correlations

被引：0
|
作者：
L. F. Rojas
M. Bina
G. Cerchiari
M. A. Escobedo-Sánchez
F. Ferri
F. Scheffold
机构：
[1] Cinvestav-IPN,Departamento de Física
[2] Università degli Studi dell’Insubria,Dipartimento di Fisica e Matematica
[3] Università degli studi di Milano,Dipartimento di Fisica
[4] University of Fribourg,Department of Physics and Fribourg Center for Nanomaterials
来源：
The European Physical Journal Special Topics | 2011年 / 199卷
关键词：
European Physical Journal Special Topic; Temporal Response; Speckle Pattern; Random Medium; Intensity Correlation;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
We show that the spectral speckle intensity correlation (SSIC) technique can be profitably exploited to recover the path length distribution of photons scattered in a random turbid medium. We applied SSIC to the study of Teflon slabs of different thicknesses and were able to recover, via the use of the photon diffusion approximation theory, the characteristic transport mean free path ℓ∗ and absorption length sa of the medium. These results were compared and validated by means of complementary measurements performed on the same samples with standard pulsed laser time of flight techniques.
引用
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页码：167 / 180
页数：13
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