Analysis of the low-frequency dispersion of the dielectric parameters in AsxSe1-x amorphous layers

This paper reports on the results of the investigation into the dispersion of the permittivity ε’ and the dielectric loss tangent tanδ for amorphous layers in the AsxSe1-x system (x = 0.4, 0.5) in the frequency range from 10−3 to 10−1 Hz. It is found that the permittivity increases with a decrease in the frequency of the polarizing field due to the possible effect exerted by defect surface states on the polarization processes occurring in the layers of this system. The shape of the Cole-Cole plots indicates the existence of several groups of relaxation oscillators that are responsible for the relaxation processes observed in this frequency range.