Theoretical investigation of Auger recombination on internal quantum efficiency of blue light-emitting diodes

被引：0
|
作者：
S.-H. Yen
M.-C. Tsai
M.-L. Tsai
Y.-J. Shen
T.-C. Hsu
Y.-K. Kuo
机构：
[1] Science-based Industrial Park,R&D Division, Epistar Co., Ltd.
[2] National Changhua University of Education,Institute of Photonics
[3] National Changhua University of Education,Department of Physics
来源：
Applied Physics A | 2009年 / 97卷
关键词：
42.25.Ja; 61.72.uj; 61.82.Fk; 73.21.Fg; 78.55.Cr;
D O I：
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中图分类号：
学科分类号：
摘要：
The Auger recombination is recently proposed as one of the possible origins for the deteriorated internal quantum efficiency of InGaN light-emitting diodes. The Auger recombination behavior is quite different under widely varied Auger coefficients. The effect of Auger coefficient on the efficiency and output power is investigated numerically. The simulation results indicate that the Auger recombination with large Auger coefficient greatly decreases the efficiency in the whole current range under study. It is found that the electron current leakage and nonuniform hole distribution are the possible mechanisms responsible for the efficiency droop at high injection current.
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页码：705 / 708
页数：3
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