Phase coarsening and crack growth rate during thermo-mechanical cycling of 63Sn37Pb solder joints

被引:0
|
作者
P. L. Hacke
Y. Fahmy
H. Conrad
机构
[1] North Carolina State University,Materials Science and Engineering Department
来源
Journal of Electronic Materials | 1998年 / 27卷
关键词
Annealing; coarsening; fatigue crack growth rate; interphase diffusion; phase size; thermo-mechanical fatigue;
D O I
暂无
中图分类号
学科分类号
摘要
The effects of phase coarsening in 63Sn37Pb solder joints produced by isothermal annealing and during thermo-mechanical cycling (TMC) on the fatigue cracked area growth rate dAc/dN were investigated. The phase coarsening by isothermal annealing was in accord with the mechanism of interphase boundary diffusion; that during TMC was significantly greater than by isothermal annealing. The phase coarsening in the range considered (D=1–5 µm, N<150 cycles) had only little, if any, influence on dAc/dN, which occurred mainly in Stage I of the fatigue crack growth rate regime. Results obtained previously, however, indicate that for N>150 cycles dAc/dN is significantly decreased by a reduction in the as-reflowed phase size. Reasonable agreement occurred between the calculated fatigue lifetime vs initial as-reflowed phase size and that measured.
引用
收藏
页码:941 / 947
页数:6
相关论文
共 50 条
  • [1] Phase coarsening and crack growth rate during thermo-mechanical cycling of 63Sn37Pb solder joints
    Hacke, PL
    Fahmy, Y
    Conrad, H
    JOURNAL OF ELECTRONIC MATERIALS, 1998, 27 (08) : 941 - 947
  • [2] Fatigue crack growth rate in 63Sn37Pb solder joints
    Guo, Z.
    Conrad, H.
    Journal of Electronic Packaging, Transactions of the ASME, 1993, 115 (02): : 159 - 164
  • [3] Effect of microstructure size on deformation kinetics and thermo-mechanical fatigue of 63Sn37Pb solder joints
    Guo, ZF
    Conrad, H
    JOURNAL OF ELECTRONIC PACKAGING, 1996, 118 (02) : 49 - 54
  • [4] Microstructure coarsening during thermo-mechanical fatigue of Pb-Sn solder joints
    Hacke, PL
    Sprecher, AF
    Conrad, H
    JOURNAL OF ELECTRONIC MATERIALS, 1997, 26 (07) : 774 - 782
  • [5] Microstructure coarsening during thermo-mechanical fatigue of Pb-Sn solder joints
    P. L. Hacke
    A. F. Sprecher
    H. Conrad
    Journal of Electronic Materials, 1997, 26 : 774 - 782
  • [6] Microstructure coarsening during thermo-mechanical fatigue of Pb-Sn solder joints
    Hacke, PL
    Sprecher, AF
    Conrad, H
    CREEP AND STRESS RELAXATION IN MINIATURE STRUCTURES AND COMPONENTS, 1996, : 217 - 232
  • [7] Microstructure coarsening during thermo-mechanical fatigue of Pb-Sn solder joints
    North Carolina State Univ, Raleigh, United States
    J Electron Mater, 7 (774-782):
  • [8] Near-threshold fatigue crack growth at 63Sn37Pb solder joints.
    Kang, KJ
    Choi, SH
    Bae, TS
    JOURNAL OF ELECTRONIC PACKAGING, 2002, 124 (04) : 385 - 390
  • [9] Effect of current stressing on the reliability of 63Sn37Pb solder joints
    Wu, B. Y.
    Chan, Y. C.
    Zhong, H. W.
    Alam, M. O.
    JOURNAL OF MATERIALS SCIENCE, 2007, 42 (17) : 7415 - 7422
  • [10] Effect of current stressing on the reliability of 63Sn37Pb solder joints
    B. Y. Wu
    Y. C. Chan
    H. W. Zhong
    M. O. Alam
    Journal of Materials Science, 2007, 42 : 7415 - 7422