X-Ray Diagnostics of Microstructure Defects of Silicon Crystals Irradiated by Hydrogen Ions

被引：0
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作者：
V. E. Asadchikov
I. G. D’yachkova
D. A. Zolotov
Yu. S. Krivonosov
F. N. Chukhovskii
机构：
[1] Shubnikov Institute of Crystallography,
[2] Federal Scientific Research Center Crystallography and Photonics,undefined
[3] Russian Academy of Sciences,undefined
来源：
Technical Physics | 2019年 / 64卷
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页码：680 / 685
页数：5
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