Memory Impedance in TiO2 based Metal-Insulator-Metal Devices

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作者
Li Qingjiang
Ali Khiat
Iulia Salaoru
Christos Papavassiliou
Xu Hui
Themistoklis Prodromakis
机构
[1] College of Electronic Science and Engineering,Department of Electrical and Electronic Engineering
[2] National University of Defense Technology,undefined
[3] Nano Research Group,undefined
[4] School of Electronics and Computer Science,undefined
[5] University of Southampton,undefined
[6] Imperial College London,undefined
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Scientific Reports | / 4卷
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摘要
Large attention has recently been given to a novel technology named memristor, for having the potential of becoming the new electronic device standard. Yet, its manifestation as the fourth missing element is rather controversial among scientists. Here we demonstrate that TiO2-based metal-insulator-metal devices are more than just a memory-resistor. They possess resistive, capacitive and inductive components that can concurrently be programmed; essentially exhibiting a convolution of memristive, memcapacitive and meminductive effects. We show how non-zero crossing current-voltage hysteresis loops can appear and we experimentally demonstrate their frequency response as memcapacitive and meminductive effects become dominant.
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