Determination of the parameters of phosphor activators in thin-film electroluminescent capacitor structures

被引：0
|
作者：
M. K. Samokhvalov
R. R. Davydov
机构：
[1] Ul’yanovsk State Technical University,
来源：
Technical Physics Letters | 2002年 / 28卷
关键词：
Phosphor; Voltage Amplitude; Excitation Cross Section; Emission Center; Phosphor Layer;
D O I：
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中图分类号：
学科分类号：
摘要：
A method for determining the concentration and electron-impact excitation cross section of activated emission centers in the phosphor layer of a thin-film electroluminescent capacitor structure, based on measurements of the brightness as a function of the applied alternating voltage amplitude and frequency, is analyzed. The error of determination of the parameters of electroluminescence excited by alternating-sign ramp voltage is evaluated. The parameters of electroluminescent structures based on the ZnS:Mn, ZnS:TbF3, and ZnS:SmF3 films are presented.
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页码：1049 / 1051
页数：2
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