Pushing the limits of lithography

被引:718
作者
Ito, T
Okazaki, S
机构
[1] Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan
[2] Assoc Super Adv Elect Technol, Atsugi, Kanagawa 2430198, Japan
关键词
D O I
10.1038/35023233
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The phenomenal rate of increase in the integration density of silicon chips has been sustained in large part by advances in optical lithography - the process that patterns and guides the fabrication of the component semiconductor devices and circuitry. Although the introduction of shorter-wavelength light sources and resolution-enhancement techniques should help maintain the current rate of device miniaturization for several more years, a point will be reached where optical lithography can no longer attain the required feature sizes. Several alternative lithographic techniques under development have the capability to overcome these resolution limits but, at present, no obvious successor to optical lithography has emerged.
引用
收藏
页码:1027 / 1031
页数:5
相关论文
共 15 条
[1]   PROJECTION ELECTRON-BEAM LITHOGRAPHY - A NEW APPROACH [J].
BERGER, SD ;
GIBSON, JM ;
CAMARDA, RM ;
FARROW, RC ;
HUGGINS, HA ;
KRAUS, JS ;
LIDDLE, JA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06) :2996-2999
[2]   REDUCTION IMAGING AT 14 NM USING MULTILAYER-COATED OPTICS - PRINTING OF FEATURES SMALLER THAN 0.1-MU-M [J].
BJORKHOLM, JE ;
BOKOR, J ;
EICHNER, L ;
FREEMAN, RR ;
GREGUS, J ;
JEWELL, TE ;
MANSFIELD, WM ;
MACDOWELL, AA ;
RAAB, EL ;
SILFVAST, WT ;
SZETO, LH ;
TENNANT, DM ;
WASKIEWICZ, WK ;
WHITE, DL ;
WINDT, DL ;
WOOD, OR ;
BRUNING, JH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06) :1509-1513
[3]   PATTERNING CHARACTERISTICS OF A CHEMICALLY-AMPLIFIED NEGATIVE RESIST IN SYNCHROTRON RADIATION LITHOGRAPHY [J].
DEGUCHI, K ;
MIYOSHI, K ;
ISHII, T ;
MATSUDA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1992, 31 (9A) :2954-2958
[4]  
*INT SEATECH, 1999, INT TECHN ROADM SEM
[5]   SOFT-X-RAY REDUCTION LITHOGRAPHY USING MULTILAYER MIRRORS [J].
KINOSHITA, H ;
KURIHARA, K ;
ISHII, Y ;
TORII, Y .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (06) :1648-1651
[6]  
Klein M.V., 1970, Optics
[7]   High-power extreme ultraviolet source based on gas jets [J].
Kubiak, GD ;
Bernardez, LJ ;
Krenz, K .
EMERGING LITHOGRAPHIC TECHNOLOGIES II, 1998, 3331 :81-89
[8]   IMPROVING RESOLUTION IN PHOTOLITHOGRAPHY WITH A PHASE-SHIFTING MASK [J].
LEVENSON, MD ;
VISWANATHAN, NS ;
SIMPSON, RA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (12) :1828-1836
[9]  
MATSUO K, 1991, IEDM, V91, P70
[10]   ELECTRON-BEAM CELL PROJECTION LITHOGRAPHY - A NEW HIGH-THROUGHPUT ELECTRON-BEAM DIRECT-WRITING TECHNOLOGY USING A SPECIALLY TAILORED SI APERTURE [J].
NAKAYAMA, Y ;
OKAZAKI, S ;
SAITOU, N ;
WAKABAYASHI, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06) :1836-1840