Application of combined micro-proton-induced X-ray emission and micro-synchrotron radiation X-ray fluorescence techniques for the characterization of impact materials around Barringer Meteor Crater

被引：6
|
作者：
Uzonyi, I
Szöör, G
Vekemans, B
Vincze, L
Rózsa, P
Szabó, G
Somogyi, A
Adams, F
Kiss, AZ
机构：
[1] Hungarian Acad Sci, Nucl Res Inst, Dept Electrostat Accelerators, H-4026 Debrecen, Hungary
[2] Univ Debrecen, Dept Geol & Mineral, H-4010 Debrecen, Hungary
[3] Univ Instelling Antwerp, Dept Chem, B-2610 Antwerp, Belgium
[4] European Synchrotron Radiat Facil, F-38043 Grenoble, France
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2004年 / 59卷 / 10-11期
关键词：
micro-PIXE; micro-SRXRF; Barringer Meteor Crater; impact materials;
D O I：
10.1016/j.sab.2004.05.030
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
A combined micro-PIXE and micro-SRXRF method has been used for the characterization of impact materials collected at the well-known Barringer Meteor Crater. Elemental maps were recorded and concentrations were determined by micro-PIXE method for the major constituents of samples. Micro-SRXRF technique was used for the complementary measurement of medium and high atomic number elements, especially the siderophilic ones. Altogether, approximately 40 elements were analyzed. These results elucidate many steps of the formation mechanism of the various impact-metamorphosed objects. (C) 2004 Published by Elsevier B.V.
引用
收藏
页码：1717 / 1723
页数：7
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