Reconstruction of extraordinary refractive index profile of O2+ ion-implanted LiNbO3 single-mode channel waveguide based on beam propagation method and image processing
被引:5
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作者:
Liu, Xiangzhi
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机构:
Shandong Univ, Sch Informat Sci & Engn, Jinan 250100, Peoples R ChinaShandong Univ, Sch Informat Sci & Engn, Jinan 250100, Peoples R China
Liu, Xiangzhi
[1
]
Lu, Fei
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机构:Shandong Univ, Sch Informat Sci & Engn, Jinan 250100, Peoples R China
Lu, Fei
Chen, Feng
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机构:Shandong Univ, Sch Informat Sci & Engn, Jinan 250100, Peoples R China
Chen, Feng
Zhang, Ruifeng
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机构:Shandong Univ, Sch Informat Sci & Engn, Jinan 250100, Peoples R China
Zhang, Ruifeng
Liu, Hanping
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机构:Shandong Univ, Sch Informat Sci & Engn, Jinan 250100, Peoples R China
Liu, Hanping
Wang, Lei
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机构:Shandong Univ, Sch Informat Sci & Engn, Jinan 250100, Peoples R China
Wang, Lei
Fu, Gang
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机构:Shandong Univ, Sch Informat Sci & Engn, Jinan 250100, Peoples R China
Fu, Gang
Wang, Haisong
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机构:Shandong Univ, Sch Informat Sci & Engn, Jinan 250100, Peoples R China
Wang, Haisong
机构:
[1] Shandong Univ, Sch Informat Sci & Engn, Jinan 250100, Peoples R China
[2] Shandong Univ, Sch Phys & Microelectron, Jinan 250100, Peoples R China
[3] Shandong Univ Architecture & Engn, Sch Sci, Jinan 250100, Peoples R China
ion implantation;
reconstruction of refractive index profile;
single-mode channel waveguide;
intensity calculation method;
D O I:
10.1016/j.optcom.2007.01.052
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
A method bases on beam propagation method and image processing is brought forward to reconstruct the extraordinary refractive index profile of the ion-implanted single-mode channel waveguide in lithium niobate. Channel waveguide is formed by O2+ ion implantation at three energies of (3.0, 3.6 and 4.5 MeV) and respective doses of (1.8, 2.2 and 4.8) x 10(14) ions/cm(2) in vacuum at room temperature. Only one enhanced-index mode is observed for extraordinary light at 1539 nm by prism-coupling method. TRIM'98 code is used to simulate the damage profile in channel waveguide. The modes pattern of TE and TM are measured by use of end-face coupling method. (C) 2007 Elsevier B.V. All rights reserved.