Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope

被引：11

作者：

Moeck, Peter ^{[1
]}

Rouvimov, Sergei

机构：

[1] Portland State Univ, Dept Phys, Nanocrystallog Grp, Portland, OR 97207 USA

来源：

ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS | 2010年 / 225卷 / 2-3期

关键词：

Precession electron diffraction; Structural fingerprinting; CRYSTAL-STRUCTURE REFINEMENT; AB-INITIO DETERMINATION; X-RAY-DIFFRACTION; PLATONIC POLYHEDRA; SHAPE AMPLITUDES; INTENSITY DATA; METAL-OXIDE; IDENTIFICATION; CRYSTALLOGRAPHY; MICRODIFFRACTION;

D O I：

10.1524/zkri.2010.1162

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The foundations of precession electron diffraction in a transmission electron microscope are outlined. A brief illustration of the fact that laboratory-based powder X-ray diffraction fingerprinting is not feasible for nanocrystals is given. A procedure for structural fingerprinting of nanocrystals on the basis of structural data that can be extracted from precession electron diffraction spot patterns is proposed.

引用

页码：110 / 124

页数：15

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