320 x 256 Short-/Mid-Wavelength dual-color infrared focal plane arrays based on Type-II InAs/GaSb superlattice

被引:11
|
作者
Sun Yaoyao
Han Xi
Hao Hongyue
Jiang Dongwei
Guo Chunyan
Jiang Zhi
Lv Yuexi
Wang Guowei
Xu Yingqiang
Niu Zhichuan [1 ]
机构
[1] Chinese Acad Sci, Inst Semicond, State Key Lab Superlatt & Microstruct, Beijing 100083, Peoples R China
基金
中国国家自然科学基金; 中国博士后科学基金;
关键词
Short-/Mid-Wavelength; T2SL; FPAs;
D O I
10.1016/j.infrared.2017.03.008
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Short-/Mid-Wavelength dual-color infrared focal plane arrays based on Type-II InAs/GaSb superlattice are demonstrated on GaSb substrate. The material is grown with 50% cut-off wavelength of 2.9 mu m and 5.1 mu m for the blue channel and red channel, separately at 77 K. 320 x 256 focal plane arrays fabricated in this wafer is characterized. The peak quantum efficiency without antireflective coating is 37% at 1.7 mu m under no bias voltage and 28% at 3.2 mu m under bias voltage of 130 mV. The peak specific detectivity are 1.51 x 1012 cm center dot Hz(1/2)/W at 2.5 mu m and 6.11x10(11) cm center dot Hz(1/2)/W at 3.2 mu m. At 77 K, the noise equivalent difference temperature presents average values of 107 mK and 487 mK for the blue channel and red channel separately. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:140 / 143
页数:4
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