Scan Compression Implementation in Industrial Design - Case Study

被引：0
|
作者：
Hsu, Dragon [1 ]
Press, Ron [2 ]
机构：
[1] Ralink Technol Corp, Jhubei City 302, Hsinchu Hsien, Taiwan
[2] Mentor Graph Corp, Silicon Test Solut, Wilsonville, OR USA
来源：
2009 ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2009年
关键词：
component; EDT; embedded compression; test power; timing;
D O I：
10.1109/ATS.2009.89
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Embedded scan test compression is used to enable high test quality and has become a standard practice on many designs. This paper describes power and timing experiences related to embedded compression technology. A commercial tool was used to implement EDT compression technology in three wireless designs . The case stud and results demonstrate the effect of power reduction methods and timing closure considerations.
引用
收藏
页码：83 / +
页数：2
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