A Design of Waveguide-to-Microstrip Transition for V-band Device Testing

被引：0
|
作者：
Xu, Qiming [1 ]
Jiang, Zhengbo [1 ]
Guo, Chong [1 ]
机构：
[1] Southeast Univ, Sch Informat Sci & Engn, State Key Lab Millimeter Waves, Nanjing 211189, Peoples R China
来源：
2022 INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY (ICMMT) | 2022年
关键词：
D O I：
10.1109/ICMMT55580.2022.10022327
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, a V-band waveguide-to-microstrip transition based on an antipodal fin-line is presented. A back-to-back transition structure is fabricated and measured. To accomplish the measurement, a metallic body with cavity is manufactured, and it could be used for further test on device like amplifier chip. The printed circuit board (PCB) is easy to be installed in the E-plane of the split-block waveguide. Measured results show that the module provides a return loss better than 14 dB and a low insertion loss across the whole V-band.
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页数：3
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