Magnetoresistive random access memory using magnetic tunnel junctions

被引:316
|
作者
Tehrani, S
Slaughter, JM
Deherrera, M
Engel, BN
Rizzo, ND
Salter, J
Durlam, M
Dave, RW
Janesky, J
Butcher, B
Smith, K
Grynkewich, G
机构
[1] Motorola Semicond Prod Sector, Embedded Memory Ctr, Tempe, AZ 85284 USA
[2] Motorola Labs, Phys Sci Res Labs, Tempe, AZ 85284 USA
关键词
magnetic switching; magnetic tunnel junction (MTJ); magnetoresistive random access memory (MRAM); micromagnetics; nonvolatile memory; tunneling magnetoresistance; ENHANCED MAGNETORESISTANCE; REVERSAL; VORTICES; STATES;
D O I
10.1109/JPROC.2003.811804
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Magnetoresistive random access memory (MRAM) technology combines a spintronic device with standard silicon-based microelectronics to obtain a combination of attributes not found in any other memory technology. Key attributes of MRAM technology are nonvolatility and unlimited read and write endurance. Magnetic tunnel junction (MTJ) devices have several advantages over other magnetoresistive devices for use in MRAM cells, such as a large signal for the read operation and a resistance that can be tailored to the circuit. Due to these attributes, MTJ MRAM can operate at high speed and is expected to have competitive densities when commercialized. In this paper we review our recent progress in the development of MTJ-MRAM technology. We describe how the memory operates. including significant aspects of reading, writing, and integration of the magnetic material with CMOS, which enabled our recent demonstration of a 1-Mbit memory chip. Important memory attributes are. compared between MRAM and other memory technologies.
引用
收藏
页码:703 / 714
页数:12
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