X-ray diffraction measurements of the c-axis Debye-Waller factors of YBa2Cu3O7 and HgBa2CaCu2O6 -: art. no. 092508

被引:4
|
作者
Kim, C [1 ]
Mehta, A
Feng, DL
Shen, KM
Armitage, NP
Char, K
Moon, SH
Xie, YY
Wu, J
机构
[1] Stanford Synchrotron Radiat Lab, Stanford, CA 94309 USA
[2] Yonsei Univ, Inst Phys & Appl Phys, Seoul 120749, South Korea
[3] Stanford Univ, Dept Phys & Appl Phys, Stanford, CA 94305 USA
[4] Fudan Univ, Dept Phys, Shanghai 200433, Peoples R China
[5] Seoul Natl Univ, Sch Phys, Seoul 151742, South Korea
[6] Seoul Natl Univ, Ctr Strongly Correlated Mat Res, Seoul 151742, South Korea
[7] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea
[8] Univ Kansas, Dept Phys & Astron, Lawrence, KS 66045 USA
关键词
D O I
10.1103/PhysRevB.67.092508
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report an application of x rays to the measurement of the temperature-dependent Bragg peak intensities to obtain Debye-Waller factors on high-temperature superconductors. Intensities of (0,0,l) peaks of YBa2Cu3O7 and HgBa2CaCu2O6 thin films are measured to obtain the c-axis Debye-Waller factors. While lattice constant and some Debye-Waller factor measurements on high-T-c superconductors show anomalies at the transition temperature, our measurements by x-ray diffraction show a smooth transition of the c-axis Debye-Waller factors through T-c. This suggests that the dynamic displacements of the heavy elements along the c-axis direction in these compounds do not have anomalies at T-c. This method in combination with measurements by other techniques will give more details concerning the dynamics of the lattice.
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页数:4
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