Optical, electrical and structural characterization of chloride-doped ZnO nanopillars obtained by electrodeposition

被引:5
|
作者
Berruet, M. [1 ]
Gau, D. L. [2 ,3 ]
Dalchiele, E. A. [2 ,3 ]
Vazquez, M. [1 ]
Marotti, R. E. [2 ,3 ]
机构
[1] Univ Nacl Mar Del Plata, CONICET, Fac Ingn, INTEMA,Div Electroquim & Corros, JB Justo 4302,B7608FDQ, Mar Del Plata, Argentina
[2] Univ Republica, Fac Ingn, Inst Fis, Julio Herrera Reissig 565,CC 30, Montevideo 11000, Uruguay
[3] Univ Republica, Fac Ingn, CINQUIFIMA, Julio Herrera Reissig 565,CC 30, Montevideo 11000, Uruguay
关键词
zinc oxide; semiconductors; optical properties; Brazilian MRS; THIN-FILMS; ZINC-OXIDE; ABSORPTION-EDGE; GROWTH; NANOWIRES; NANOSTRUCTURES; TRANSPARENT; ORIENTATION; DEPENDENCE; DEPOSITION;
D O I
10.1088/0022-3727/49/21/215103
中图分类号
O59 [应用物理学];
学科分类号
摘要
As-grown and chloride-doped ZnO nanopillars were electrodeposited onto bare FTO/glass and ZnO-compact layer/FTO/glass substrates. To analyse the effect of the presence of chloride ions in the electrolytic bath, NH4Cl was progressively added up to 0.02 mol l(-1.) As a preliminary examination, the morphology of ZnO nanostructures was analysed by SEM micrographs and chlorine incorporation was detected by EDS. Then, a detailed analysis comprising structural, electrical, optical and defect properties was constructed using XRD, electrical resistance measurements and UV-Vis-IR spectroscopy. As the chlorine concentration in the film increases, XRD reveals a displacement of diffracted planes due to macrostrain of the ZnO lattice and the electrical resistance diminishes. Also, the UV optical absorption edge shifts to higher energies due to the Moss-Burstein effect, which corresponds to electron densities in the order of 1-6 x 10(19) cm(-3), and the infrared spectra reveal the presence of free electrons, allowing a more precise determination of the free electron densities.
引用
收藏
页数:10
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