Efficient silicon light emitting diodes made by dislocation engineering

被引:27
|
作者
Lourenço, MA
Siddiqui, MSA
Gwilliam, RM
Shao, G
Homewood, KP [1 ]
机构
[1] Univ Surrey, Sch Elect & Phys Sci, Guildford GU2 7XH, Surrey, England
[2] Univ Surrey, Sch Engn, Guildford GU2 7XH, Surrey, England
来源
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES | 2003年 / 16卷 / 3-4期
基金
英国工程与自然科学研究理事会;
关键词
silicon; electroluminescence; dislocation engineering; light emitting devices; iron disilicide; erbium;
D O I
10.1016/S1386-9477(02)00690-2
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Efficient silicon-based light emitting diodes have been fabricated using the dislocation engineering method. Crucially this technique uses entirely conventional ULSI processes. The devices were fabricated by conventional low-energy boron implantation into silicon substrates followed by high-temperature annealing, and strong silicon band edge luminescence was observed. Dislocation engineering is also shown to reduce the thermal quenching for other material systems. Dislocation engineered beta-FeSi2 and Er light emitting devices were fabricated and room temperature electroluminescence at similar to1.5 mum was observed in both cases. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:376 / 381
页数:6
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