Microstructure and magnetic properties of Co(Cr)/Ti(Cr)/ZnO films prepared by laser ablation on Si substrates

被引:0
|
作者
Zeng, Fanhao [1 ]
Xiong, Xiang [1 ]
Huang, Baiyun [1 ]
机构
[1] Cent S Univ, Powder Met Res Inst, State Key Lab Powder Met, Changsha 410083, Hunan, Peoples R China
来源
基金
中国国家自然科学基金; 美国国家科学基金会; 中国博士后科学基金;
关键词
THIN-FILMS; PERFORMANCE; EVAPORATION; MEDIA;
D O I
10.1007/s00339-010-5546-y
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
High-quality Co(Cr)(50-66 nm)/Ti(Cr)(25-30 nm)/ZnO(165-225 nm) films were grown on Si substrates by the pulsed-laser deposition technique at 450-500A degrees C. The microstructure of the films and their magnetic properties were investigated by X-ray diffraction, transmission electron microscopy and a vibrating sample magnetometer. It was found that the Co(Cr)/Ti(Cr)/ZnO thin films had a highly preferential c-axis direction normal to the surface of the substrate, and the ZnO sublayer had columnar structures in the growth direction. The interface of the multi-layer films is smooth without interface reaction. The as-produced films had in-plane easy magnetization. It indicates that the enhancements of the magnetic properties of the films are mainly ascribed to the grain structure and multi-domain state of the Co-alloy layer, which can be controlled by the ZnO sublayer.
引用
收藏
页码:459 / 463
页数:5
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