Effect of thermal stress on magnetic domain patterns of multiferroic Bi1-xDyxFeO3 thin films

被引：8
|
作者：
Palkar, V. R. [1 ]
Prashanthi, K. [1 ]
Mandal, M. [1 ]
机构：
[1] Indian Inst Technol, Dept Elect Engn, Ctr Excellence Nanoelect, Bombay 400076, Maharashtra, India
来源：
MATERIALS LETTERS | 2010年 / 64卷 / 13期
关键词：
Atomic force microscopy; Magnetic; Thin film;
D O I：
10.1016/j.matlet.2010.03.055
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Effect of temperature on magnetic domain structure of Bi-0 Dy-7(0) 3FeO3 (BDFO) multiferroic thin films is studied in situ using magnetic force microscopy (MFM). Initially, as the temperature increases the domains start aligning from irregular to more distinct stripe pattern However. above 250 degrees C, the domain alignment is disturbed The systematic change in the domain configuration with temperature, suggests a strong thermal history of the system The randomness in domain alignment caused above 250 degrees C is correlated to internal stress developed during ferromagnetic to paramagnetic phase transition occurring in BDFO Indirect experimental evidence is given to support the explanation based on stress (C) 2010 Elsevier BV All rights reserved
引用
收藏
页码：1455 / 1457
页数：3
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