Recent progress of subwavelength photon trapping HgCdTe infrared detector

被引:0
|
作者
Hu Wei-Da [1 ]
Liang Jian [1 ]
Yue Fang-Yu [2 ]
Chen Xiao-Shuang [1 ]
Lu Wei [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China
[2] E China Normal Univ, MOE, Key Lab Polar Mat & Devices, Shanghai 200241, Peoples R China
基金
中国国家自然科学基金;
关键词
HgCdTe infrared detectors; subwavelength microstructure; photon trapping; long wavelength infrared detectors; surface plasmon polaritons; NUMERICAL-SIMULATION; DARK CURRENT; PHOTODETECTION; ABSORPTION;
D O I
暂无
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Recent progress of HgCdTe infrared detector with subwavelength photon trapping structure has been reviewed in this paper. A combination approach of finite element method and finite differedce time domain method, which can be used for jointly simulating of "light" and "electricity" characteristics in infrared detector, was systematically introduced. Numerical simulation and analysis results based on the HgCdTe infrared detectors with subwavelength microstructure were also demonstrated. The theoretical analysis and experimental data have shown that the subwavelength microstructure can trap photons in active region of infrared detectors. The subwavelength photon trapping structure has a promising prospect on improving the performance of long wavelength infrared detector.
引用
收藏
页码:25 / +
页数:13
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