Coulomb-actuated microbeams revisited: experimental and numerical modal decomposition of the saddle-node bifurcation

被引:9
|
作者
Melnikov, Anton [1 ]
Schenk, Hermann A. G. [2 ]
Monsalve, Jorge M. [1 ]
Wall, Franziska [1 ]
Stolz, Michael [1 ,3 ]
Mrosk, Andreas [1 ]
Langa, Sergiu [1 ]
Kaiser, Bert [1 ]
机构
[1] Fraunhofer Inst Photon Microsyst IPMS, D-01109 Dresden, Germany
[2] Arioso Syst GmbH, D-01109 Dresden, Germany
[3] Brandenburg Univ Technol Cottbus Senftenberg, D-03046 Cottbus, Germany
关键词
COMPUTER-AIDED GENERATION; ORDER DYNAMIC MACROMODELS; MICROELECTROMECHANICAL SYSTEMS; MEMS; OPTIMIZATION; FABRICATION; MODELS;
D O I
10.1038/s41378-021-00265-y
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Electrostatic micromechanical actuators have numerous applications in science and technology. In many applications, they are operated in a narrow frequency range close to resonance and at a drive voltage of low variation. Recently, new applications, such as microelectromechanical systems (MEMS) microspeakers (mu Speakers), have emerged that require operation over a wide frequency and dynamic range. Simulating the dynamic performance under such circumstances is still highly cumbersome. State-of-the-art finite element analysis struggles with pull-in instability and does not deliver the necessary information about unstable equilibrium states accordingly. Convincing lumped-parameter models amenable to direct physical interpretation are missing. This inhibits the indispensable in-depth analysis of the dynamic stability of such systems. In this paper, we take a major step towards mending the situation. By combining the finite element method (FEM) with an arc-length solver, we obtain the full bifurcation diagram for electrostatic actuators based on prismatic Euler-Bernoulli beams. A subsequent modal analysis then shows that within very narrow error margins, it is exclusively the lowest Euler-Bernoulli eigenmode that dominates the beam physics over the entire relevant drive voltage range. An experiment directly recording the deflection profile of a MEMS microbeam is performed and confirms the numerical findings with astonishing precision. This enables modeling the system using a single spatial degree of freedom.
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页数:13
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