Calibration method for division of focal plane polarimeters

被引:23
|
作者
Fei, Huang [1 ,2 ,3 ]
Li, Fan-Ming [1 ,3 ]
Chen, Wei-Cong [1 ,3 ]
Zhang, Rui [1 ,2 ,3 ]
Chen, Chao-Shuai [4 ]
机构
[1] Chinese Acad Sci, Key Lab Infrared Syst Detect & Imaging Technol, Shanghai 20083, Peoples R China
[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
[3] Chinese Acad Sci, Shanghai Inst Tech Phys, Shanghai 200083, Peoples R China
[4] Xian Inst Appl Opt, Xian 71006, Shaanxi, Peoples R China
关键词
MICROGRID POLARIMETERS; ARRAY;
D O I
10.1364/AO.57.004992
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The division of focal plane polarimeters is fabricated out of nanowire polarization filters attached to the surface of a focal plane array. Due to limitations in the manufacturing process, the transmissivity of each nanowire polarization filter is different, resulting in a combination of inhomogeneities in transmittance and detector response, and which also yields the problem of polarization imaging uniformity, a more complicated method than traditional intensity imaging. This study presents a brand new nonuniformity correction method for solving the correction inaccuracies in the traditional method. The method corrected the polarization filter transmittance with detector gain based on a new method for calculating the degree of linear polarization (DoLP). This paper includes the theoretical derivation, experimental testing, and numerical simulation. In this simulation environment, the DoLP value was accurately calculated. (C) 2018 Optical Society of America.
引用
收藏
页码:4992 / 4996
页数:5
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