Macromodeling of identification device of signals of exact time

被引:0
|
作者
Tyrnoshchuk, P [1 ]
Shapovalov, Y [1 ]
机构
[1] Lviv Polytech Natl Univ, UA-79013 Lvov, Ukraine
关键词
macromodel; regularized minimization problem; imlicit form;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper the mathematical macromodel of device which determines the moments of arriving of exact time signals has been built. The macromodel is determined by solving of minimization problem of imlicit form multivariate polynomial using circuit input and output signals. The macromodel is obtained in the form of fraction rational function.
引用
收藏
页码:65 / 66
页数:2
相关论文
共 50 条
  • [2] Accurate macromodeling algorithm for time domain identification of transient port responses
    Deschrijver, D.
    Dhaene, T.
    INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, 2012, 25 (01) : 24 - 38
  • [3] Loewner-based macromodeling with exact interpolation constraints
    Lefteriu, Sanda
    Grivet-Talocia, Stefano
    2016 IEEE 25TH CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS (EPEPS), 2016, : 43 - 45
  • [4] Parameter identification and macromodeling of hysteresis phenomena
    Peters, D
    Rehfuss, S
    Laur, R
    Brachtendorf, HG
    DTIP 2003: DESIGN, TEST, INTEGRATION AND PACKAGING OF MEMS/MOEMS 2003, 2003, : 79 - 83
  • [5] An identification technique for macromodeling of long interconnects
    de Magistris, M
    De Tommasi, L
    Signal Propagation on Interconnects, Proceedings, 2005, : 185 - 188
  • [6] Parametric macromodeling of time domain responses
    Deschrijver, D.
    Dhaene, T.
    2008 IEEE WORKSHOP ON SIGNAL PROPAGATION ON INTERCONNECTS, 2008, : 185 - 186
  • [7] USE OF ARTIFICIAL EARTH SATELLITES TO TRANSMIT EXACT TIME SIGNALS
    PALII, GN
    IVANOVA, YD
    MALOV, AG
    OKSENTYUK, AR
    MEASUREMENT TECHNIQUES, 1976, 19 (10) : 1480 - 1484
  • [8] A New Method for Wellhead Device Defect Identification with Ultrasonic Signals
    Wei Minghui
    Chen Hongjun
    Deng Aihua
    Tao Qiuyang
    He Yilin
    Russian Journal of Nondestructive Testing, 2023, 59 : 964 - 976
  • [9] A New Method for Wellhead Device Defect Identification with Ultrasonic Signals
    Minghui, Wei
    Hongjun, Chen
    Aihua, Deng
    Qiuyang, Tao
    Yilin, He
    RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING, 2023, 59 (09) : 964 - 976
  • [10] A proposition on floating gate neuron MOS macromodeling for device fabrications
    Ochiai, T
    Hatano, H
    IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 1999, E82A (11): : 2485 - 2491