Simultaneous five-wavelength interferometry for head/tape spacing measurement

被引：3
|
作者：
Zhu, J
Baugh, E
Talke, FE [1 ]
机构：
[1] Univ Calif San Diego, CMRR, La Jolla, CA 92093 USA
[2] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA
来源：
TRIBOLOGY INTERNATIONAL | 2000年 / 33卷 / 5-6期
关键词：
interferomertry; head/tape interface; tribology;
D O I：
10.1016/S0301-679X(00)00061-X
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
An improved five-wavelength interferometer with high-speed shutters in the light path was designed and implemented. The interferometer allows switching between two sets of three wavelengths, keeping one wavelength in each measurement in common. The set-up allows nearly simultaneous acquisition of fringe intensities and can be used to measure the head/tape spacing in a moving linear tape drive. The precision of the new five-wavelength interferometer was investigated and was found to be superior to the precision obtained with a three-wavelength interferometer. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：409 / 414
页数：6
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