Charged particle flows in the beam extraction region of a negative ion source for NBI

被引：18

作者：

Geng, S. ^{[1
]}

Tsumori, K. ^{[1
,2
]}

Nakano, H. ^{[1
,2
]}

Kisaki, M. ^{[2
]}

Ikeda, K. ^{[2
]}

Osakabe, M. ^{[1
,2
]}

Nagaoka, K. ^{[1
,2
]}

Takeiri, Y. ^{[1
,2
]}

Shibuya, M. ^{[2
]}

Kaneko, O. ^{[1
,2
]}

机构：

[1] Grad Univ Adv Studies, SOKENDAI, 322-6 Oroshi, Toki, Gifu 5095292, Japan

[2] Natl Inst Fus Sci, 322-6 Oroshi, Toki, Gifu 5095292, Japan

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2016年 / 87卷 / 02期

关键词：

PROBE; ITER;

D O I：

10.1063/1.4931796

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Experiments by a four-pin probe and photodetachment technique were carried out to investigate the charged particle flows in the beam extraction region of a negative hydrogen ion source for neutral beam injector. Electron and positive ion flows were obtained from the polar distribution of the probe saturation current. Negative hydrogen ion flow velocity and temperature were obtained by comparing the recovery times of the photodetachment signals at opposite probe tips. Electron and positive ions flows are dominated by crossed field drift and ambipolar diffusion. Negative hydrogen ion temperature is evaluated to be 0.12 eV. (C) 2015 AIP Publishing LLC.

引用

页数：4

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