Elastic scattering by hot electrons and apparent lifetime of longitudinal optical phonons in gallium nitride

被引:7
|
作者
Khurgin, Jacob B. [1 ]
Bajaj, Sanyam [2 ]
Rajan, Siddharth [2 ]
机构
[1] Johns Hopkins Univ, Dept Elect & Comp Engn, Baltimore, MD 21218 USA
[2] Ohio State Univ, Dept Elect & Comp Engn, Columbus, OH 43210 USA
关键词
RAMAN; SATURATION; VELOCITY; DECAY; GAN;
D O I
10.1063/1.4938745
中图分类号
O59 [应用物理学];
学科分类号
摘要
Longitudinal optical (LO) phonons in GaN generated in the channel of high electron mobility transistors (HEMT) are shown to undergo nearly elastic scattering via collisions with hot electrons. The net result of these collisions is the diffusion of LO phonons in the Brillouin zone causing reduction of phonon and electron temperatures. This previously unexplored diffusion mechanism explicates how an increase in electron density causes reduction of the apparent lifetime of LO phonons, obtained from the time resolved Raman studies and microwave noise measurements, while the actual decay rate of the LO phonons remains unaffected by the carrier density. Therefore, the saturation velocity in GaN HEMT steadily declines with increased carrier density, in a qualitative agreement with experimental results. (C) 2015 AIP Publishing LLC.
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页数:5
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