The Design of Distributed Hardware Platform for Complex Electronic System Testing

被引：0
|
作者：
Wei, Chang'an [1 ]
Wang, Gang [1 ]
Sheng, Yunlong [1 ]
Jiang, Shouda [1 ]
Tian, Xiangyu [1 ]
机构：
[1] Harbin Inst Technol, Dept Automat Test & Control, Xidazhistr 92, Harbin 150080, Peoples R China
来源：
ADVANCES IN INTELLIGENT INFORMATION HIDING AND MULTIMEDIA SIGNAL PROCESSING, VOL 2 | 2017年 / 64卷
关键词：
complex electronic system; embedded software testing; memory reflective technique;
D O I：
10.1007/978-3-319-50212-0_33
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
Due to complex interface in the complex electronic system which contains embedded software, such as RS422, CAN, analog and digital input/output interface. In addition, embedded software in complex electronic system usually controls a large number of peripherals, there are usually no enough external test resources in one computer, according to this problem, we provide distributed structure to construct the software testing system. In hardware, a high-speed information transmission mechanism based on memory reflective technique is studied, and a multi-functional reflective memory communication cards is developed, using optical fiber to form a high speed data transmission network, realizing automatic data input and test result obtain.
引用
收藏
页码：269 / 276
页数：8
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