Near-field fluorescence and topography characterization of a single nanometre fluorophore by apertureless tip-enhanced scanning near-field Microscopy

被引：1
|
作者：
Xiao-Bin, Wu [1 ]
Jia, Wang
Ji-Ying, Xu
Rui, Wang
Qian, Tian
Jian-Yuan, Yu
机构：
[1] Tsinghua Univ, Dept Precis Instruments, State Key Lab Precis Measurement Technol & Instru, Beijing 100084, Peoples R China
[2] Tsinghua Univ, Anal Ctr, Dept Chem, Beijing 100084, Peoples R China
来源：
CHINESE PHYSICS LETTERS | 2007年 / 24卷 / 09期
关键词：
OPTICAL MICROSCOPY; SPECTROSCOPY;
D O I：
10.1088/0256-307X/24/9/017
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Tip-enhanced near-field fluorescence and topography characterization of a single nanometre fluorophore is conducted by using an apertureless scanning near-field microscopy system. A fluorophore with size 80 nm is mapped with a spatial resolution of 10 nm. The corresponding near-lield fluorescence data shows significant signal enhancement due to the apertureless tip-enhanced effect. With the nanometre spatial resolution capability and nanometre local tip-enhanced effect, the apertureless tip-enhanced scanning near-field microscopy may be further used to characterize a single molecule by realizing the local near-lield spectrum assignment corresponding to topography at nanometre scale.
引用
收藏
页码：2525 / 2528
页数：4
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