Theory of polarization dependence in resonant X-ray emission spectroscopy of Ce compounds

被引：23

作者：

Nakazawa, M ^{[1
]}

Ogasawara, H

Kotani, A

机构：

[1] JASRI, SPring 8, Sayo, Hyogo 6795198, Japan

[2] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2778581, Japan

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 2000年 / 69卷 / 12期

关键词：

resonant X-ray emission; impurity Anderson model; Ce compounds; polarized X-rays; scattering angle;

D O I：

10.1143/JPSJ.69.4071

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We calculate the Ce 4f --> 3d resonant X-ray emission spectroscopy (4f --> 3d RXES) of Ce compounds, CeF3 and CeO2, by means of ionic and impurity Anderson model with full multiplet effects, respectively. The calculation is based on the second-order optical formula, and the effect of the X-ray polarization is taken into account. The calculated results of 4f --> 3d RXES show the strong dependence on the X-ray polarization: as well as on the scattering angle. Using the selection rule of the dipole transition with polarized X-rays, the calculated spectral features are explained.

引用

页码：4071 / 4077

页数：7

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