Er-doped dielectric films by radiofrequency magnetron co-sputtering

被引:4
|
作者
Cattaruzza, E. [1 ]
Battaglin, G. [1 ]
Muzio, M. [1 ]
Riello, P. [1 ]
Trave, E. [1 ]
机构
[1] Univ Ca Foscari Venezia, Dept Phys Chem, I-30172 Venice, Italy
来源
SURFACE & COATINGS TECHNOLOGY | 2010年 / 204卷 / 12-13期
关键词
Rf magnetron sputtering; Erbium; Photoluminescence; Silica; Alumina; ENERGY-TRANSFER; WAVE-GUIDES; ERBIUM; GLASSES; PHOTOLUMINESCENCE; SILVER;
D O I
10.1016/j.surfcoat.2009.09.068
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The radiofrequency magnetron sputtering co-deposition is potentially an excellent synthesis technique to obtain Er-doped dielectric films, materials characterized by the emission of an intense photoluminescence signal at lambda = 1.54 mu m (the most used wavelength in fiber glass for optical telecommunications). A comparison of the emission of Er(3+) ions in different matrices such as silica and alumina is made. All of the deposited Er-doped films showed a photoluminescence yield strongly dependent on the condition of synthesis (in particular, on the way to furnish energy to the growing film) and on the post-synthesis annealing. In all cases, the photoluminescence yield of Er:Al(2)O(3) films was larger than that of Er:SiO(2) ones. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:2023 / 2027
页数:5
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