Photo-induced defects in amorphous thin films of Se70Te22Zn8

被引：3
|
作者：
Yadav, Sarish [1 ]
Sharma, S. K. [1 ]
Kumar, A. [1 ]
机构：
[1] Harcourt Butler Technol Inst, Dept Phys, Kanpur 208002, Uttar Pradesh, India
来源：
PHYSICA B-CONDENSED MATTER | 2010年 / 405卷 / 07期
关键词：
Defects; TSC; Chalcogenide glasses; Thin films; THERMALLY-STIMULATED-CURRENTS; STATES;
D O I：
10.1016/j.physb.2010.01.058
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Amorphous thin films of glassy alloy of Se(70)Te(22)Zng have been prepared by vacuum evaporation technique. These films are exposed to white light of intensity 1200 lux at room temperature in a Vacuum similar to 10(-2) Torr. Exposure time is varied from 60-360 min. Thermally stimulated currents have been measured before and after exposure of light in the temperature range 305-370 K. Using these measurements, density of traps (N-t) have been calculated for different exposure times. It is observed that the density of traps (N-t) increases with the increase of exposure time. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码：1839 / 1841
页数：3
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