Focused ion beam imaging of grains in Al-Li-Cu quasicrystal

被引：7
|
作者：
Wang, K
Garoche, P
Dumoulin, L
机构：
[1] Univ Paris Sud, CNRS, Phys Solides Lab, F-91405 Orsay, France
[2] IN2P3, CSNSM, F-91405 Orsay, France
来源：
JOURNAL OF PHYSICS-CONDENSED MATTER | 1998年 / 10卷 / 16期
关键词：
D O I：
10.1088/0953-8984/10/16/002
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
We report the observation of grain structures, as well as their evolution following annealing, in Al-Li-Cu quasicrystal single-phased samples. The investigation is performed by using scanning ion microscopy employing focused ion beam imaging from secondary electrons. On annealing, the grain sizes increase through the recrystallization process. Regular grain boundaries are observed. Their orientation and stability are discussed in relation with the AI-Li-Cu quasiperiodic structure.
引用
收藏
页码：3479 / 3488
页数：10
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