Diffracted-beam analyzer with multiple single crystals for high resolution parallel-beam X-ray diffraction

A new high-performance diffracted-beam analyzer consisting of multiple pieces of perfect crystals in a form of simple and compact device is proposed. Pieces of crystals are set so as to fit their crystal lattice planes with tangent planes of logarithmic spiral, and crystal surfaces of the analyzer form a shape of one-dimensional polygon. Each piece of the crystals works in the same manner as the single crystal analyzer. A diffracted X-ray beam from a specimen is successively reflected by the individual crystals of the analyzer, and reflected Xray beams are detected separately by one-dimensional position sensitive detector. If the analyzer consists of, for example, ten pieces of the crystals, ten diffraction patterns can be obtained in a single diffractometer scan. Thus a resultant intensity becomes greater by one order of magnitude, whereas the angular resolution is the same as that of the single crystal analyzer. Instrumental setup and experimental results are described.